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QA-1000HC
Full Featured Programmable Analog Supply Current Monitor
FEATURES
Wide IDDX Measurement BW: 0 - 5 MHz High IDDX resolution: 300 ARMS High IDDX Measurement Range: 0 - 2 A High Loading Capacitance: 0 - 100 F Low internal resistance: 25m
APPLICATIONS
Continuous Analog Supply Current Measurement Static and transient Analog Supply Current Measurements Positive and negative supply and ground current measurement Analog Current Measurements
DESCRIPTION
The QA-1000HC is a configurable analog supply current monitor, designed for loadboard applications. Its low internal resistance ensures its transparency (causing only a negligible voltage drop when inserted into the supply or ground path of the device under test). The module is designed to be inserted between the DUT supply provided by the ATE and the supply pin of the DUT or between ground and DUT ground. The VDUT supply can be positive or negative (VDD/VCC or VSS/VEE). The QA-1000HC is designed to accurately measure analog (supply) currents up to 2A (upon demand the range can be adapted to 100mA, 200mA, 500mA, 1A or 5A), thereby providing a high measurement repeatability. The monitor has a bandwidth of 5MHz, offers a resolution of 300A @2A, and is capable to drive high capacitive loads up to 100uF. The resolution and performance of the monitor is a function of the selected bandwidth and the value of the loading capacitance CL (the DUT local on-pin supply decoupling capacitance). The QA-1000HC has no digital control pins. It measures continuously and relies for further signal processing and decision making on the capabilities of the mixed-signal ATE. The QA-1000HC provides an analog output voltage, corresponding to the measured current. The figure shows a block diagram of the QA-1000HC as well as a typical application diagram. The output has a 50 impedance for optimum RF performance. The low resistive output can be customised when AF performance is preferred. The QA-1000HC consists of 2 active units, a measurement unit (MU) and a processing unit (PU). The SUPPLY measurement unit is a fast and sensitive current measurement device that converts the measured analog current in a corresponding voltage. The processing unit is QA-1000HC configurable and provides amplification and filtering VIDD PU MU functionality. The QA-1000HC has a low internal resistance between its VDUT and DUT terminals, therefore the voltage at the DUT terminal closely follows the supply CL voltage applied at its VDUT terminal within a -7V to +7V range. The QA-1000HC has a broad application range. ATE Examples are the application to high-power ICs and during TEST V ECT ORS voltage stress test applications. By using two QA-1000-HC monitors, supply currents of analog DUTs with (symmetrical) +/- supply can also be measured simultaneously.
VDUT VCC VEE DUT
(c) Q-Star Test nv, 2003 Revision C - page 1 of 6 L.Bauwensstraat 20, B-8200 Brugge, Belgium, Tel.: +32 50 319273, Fax: +32 50 312350, http://www.Qstar.be
DUT
GND
DUT
SUPPLY
QA-1000HC
ELECTRICAL SPECIFICATIONS
Measured at VDUT=+5.00V, VCC= +12.0V, VEE= -12.0V, T=20C
SYMBOL PARAMETER
Power Supply
VCC VEE ICCQ IEEQ IDUT VDUT IVDUT Positive Supply Voltage Negative Supply Voltage Quiescent Supply Current Quiescent Supply Current DUT Supply Current DUT Supply Voltage (1) Input Bias Current
CONDITION
MIN
+11.5 -11.5
TYP
+12 -12 +12 -12
MAX UNITS
+16 -16 +40 -40 2 +7.0 2 V V mA mA A V A mARMS mARMS mARMS mA %
mV/mA
@ IDUT=0mA @ IDUT=0mA 0 -7.0
Input Range
DC Accuracy
IDUT Resolution
(2)
@ CL=100nF, f-3dB=50kHz @ CL=100nF, f-3dB=500kHz @ CL=100nF, f-3dB=5MHz
I/V
Measurement Offset Gain error I/V Conversion Ratio @ CL=100nF, JP2,3=OFF @ CL=100nF, JP2=ON, JP3=OFF @ CL=100nF, JP2=OFF, JP3=ON @ CL=100nF, JP2,3=OFF @ CL=100nF -2 0
0.3 1 2 2 0.1 2.5 5000 500 50 TBD TBD
5 0.5
AC Characteristics
IDUT -3dB bandwidth SR THD IDUT CL Slew Rate Total Harmonic Distortion DUT current Loading Capacitance CL Between DUT & VDUT DUT - VDUT voltage drop
(1) (2)
kHz kHz kHz V/s dB 2 100 A uF m mV
DUT Output
Internal Resistance
@ IDUT=2A 25 50
The VDUT pin must be permanently connected to a voltage source and must notbe left floating. Considering clean supplies and no external noise pick up at VDUT/DUT terminals such as switching noise from ATE power supply.
ABSOLUTE MAXIMUM RATINGS
Parameter
VCC VEE VDUT IDUT Operating Temperature Range Storage Temperature Lead Temperature (10sec) (1)
(1)
With Respect To
GND GND GND GND
Min
-0.3 -18 -0.3 -3 0 -40
Max
+18 +0.3 10 3 +70 +80 +220
Units
V V V A C C C
Manual soldering is recommended using standard eutectic Sn63Pb solder.
NOTE: Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum ratings for extended periods may affect device reliability.
(c) Q-Star Test nv, 2003 Revision C - page 2 of 6 Due to continuous pursuit of innovation, the technical specifications listed are subject to change without notice.
QA-1000HC
CONFIGURING THE QA-1000HC
The processing unit of the QA-1000HC is configurable by making the proper pin (jumper) connections. A set of jumpers (JP2&3) determines the filter characteristics, allowing to select the actual bandwidth (5MHz, 500kHz or 50kHz) in function of desired speed and accuracy. These configurations can be changed upon request. More information on how to configure the QA-1000HC can be found in application note AN0024.
State JP JP2
(1) (2)
ON 500 kHz 50 kHz
OFF 5 MHz
(1) (2)
JP3 (1) (2)
Setting of bandwidth JP2 and JP3 must be closed exclusively, only one of them might be closed for a given configuration.
CALIBRATION
Due to component tolerances and potential leakage currents caused by the test set-up (e.g. PMU channel connected to DUT terminal), the current-to-voltage ratio (I/V) of the QA-1000HC can differ from module to module and/or test set-up to test set-up. Therefore, to perform accurate measurements, a calibration of each module in relation to the test set-up used is recommended. Once the module has been calibrated, there is no need to repeat this procedure for every application provided the measurement conditions remain. The calibration of the QA-1000HC can be easily performed as the module has a linear transfer characteristic. More information on how to calibrate the QA-1000HC module can be found in application note AN0025.
APPLICATION
The QA-1000HC should be placed as close as possible to the DUT. All connections to the QA1000HC should be well designed not to degrade the monitor's accuracy. The QA-1000HC's power-on delay time is about 1 second. The VDUT pin must be permanently connected to a voltage source (0V7V) and not left floating. Although the monitor has a very high ripple rejection ratio even at RF, the ATE should deliver a good quality VDUT reference signal (DUT supply voltage reference) for the DUT. The value of the on-pin decoupling capacitance (CL) is preferable in the 100pF - 1uF range, higher values can be handled but decrease the monitor's measurement bandwidth. Global decoupling capacitors should be placed at the VDUT side of the monitor if RF operation of VDUT is not needed. All possible application diagrams are shown below.
2A RANGE, 5 MHz BANDWIDTH
47F ATE DUT Supply
+
2A RANGE, 500 kHz BANDWIDTH
+
100nF
47F
ATE DUT Supply 100nF
12 11 10
+ 15V 100nF To analog ATE input
16 15
+ 15V To analog ATE input
10 16 15 9
14
13
12
11
100nF
14
13
VIDD
GND
VIDD
GND
VCC
VDUT
VDUT
VDUT
VDUT
VCC
VDUT
VDUT
JP3
QA-1000HC
JP23 GND GND DUT DUT DUT DUT VEE JP2 NC NC
QA-1000HC
VEE JP23
7
DUT
DUT
1
2
3
4
5
6
7
8
1
2
3
4
5
6
100nF
- 15V VDD / VEE
100nF
- 15V VDD / VEE CL
DUT
CL
GND
GND
(c) Q-Star Test nv, 2003 Revision C - page 3 of 6 Due to continuous pursuit of innovation, the technical specifications listed are subject to change without notice.
DUT
8
JP2
JP3
NC
NC
9
QA-1000HC
2A RANGE, 50 kHz BANDWIDTH
+
47F
ATE DUT Supply 100nF
12 11 10
+ 15V To analog ATE input
16 15 14 13
VIDD
GND
VDUT
VCC
VDUT
VDUT
QA-1000HC
JP23 GND DUT DUT DUT VEE JP2 VDD / VEE CL GND NC
1
2
3
4
5
6
7
100nF
- 15V
PIN DESCRIPTION
The QA-1000HC has a standard 16 pins wide DIL footprint.
Pin # 1 2 3 4 5 6 7 Name NC DUT GND VEE DUT DUT JP23 Type Function Not Connected DUT supply pin Monitor ground Monitor negative supply pin ( -12V) DUT supply pin DUT supply pin Monitor configuration pin - common pin for JP2 and JP3 Monitor configuration pin - JP2 JP2 and JP3 allow selecting the bandwidth of the module. If both JP2 and JP3 are open (NOT connected) then the monitor operates with maximum bandwidth (5MHz). If JP2 is closed (JP2 shortened to JP23) then the bandwidth is limited to about 500kHz Monitor configuration pin - JP3 JP2 and JP3 allow setting the bandwidth of the module. If both JP2 and JP3 are open (NOT connected) then the monitor operates with maximum bandwidth (5MHz). If JP3 is closed (JP3 shortened to JP23) then the bandwidth is limited to about 50kHz Not Connected DUT supply reference input DUT supply reference input Monitor positive supply pin (+12V) Monitor ground DUT supply reference input Analog IDD output voltage
O S S O O C
8
JP2
(1)(2)
C
9
JP3
(1)(2)
C
10 11 12 13 14 15 16
NC (3) VDUT VDUT VCC GND VDUT VIDD
(3)
I I S S I O
(3)
(1) JP2 and JP3 should be closed exclusively, only one of them might be closed for a given configuration, they must not be closed at the same time (if not, cut off frequency will be 45kHz instead of 50kHz). (2) For optimum performance, the connection between JP2-JP23 or JP3-JP23 must be as short as possible. (3) The VDUT pin must be permanently connected to a voltage source and must not be left floating.
(c) Q-Star Test nv, 2003 Revision C - page 4 of 6 Due to continuous pursuit of innovation, the technical specifications listed are subject to change without notice.
DUT
8
JP3
NC
9
QA-1000HC
16 15 14 13 12 11 10
VDUT
VCC
VDUT
VDUT
VIDD
GND
QA-1000HC
JP23
7
d2
GND
DUT
DUT
DUT
VEE
1
2
3
4
5
6
Top View
p e
Land Pattern Recommendation
8
JP2
NC
JP3
NC
9
p
W2 W1
1
d1 W2
E1 L
E2
Side View
MAX Component Area H3 H2 H1
SEATING PLANE
d3
d4
p
Unit inches mm
W1
0.700 17.80
W2
0.600 15.24
L
1.525 38.735
P
0.10 2.54
d1
0.035 0.90
d2
0.067 1.70
d3
0.020 0.50
d4
0.039 1.00
Unit inches mm
H1
0.591 15.00
H2
0.453 11.50
H3
0.335 8.50
E1
0.375 9.525
E2
0.450 11.43
e
0.050 1.27
(c) Q-Star Test nv, 2003 Revision C - page 5 of 6 Due to continuous pursuit of innovation, the technical specifications listed are subject to change without notice.
QA-1000HC
LIST OF APPLICATION NOTES
A series of applications notes concerning the QA-1000HC is listed below: AN0024 AN0025 Performing measurements with the QA-1000HC Calibrating the QA-1000HC
Information furnished by Q-Star Test is believed to be accurate and reliable. However, no responsibility is assumed by Q-Star Test for its use, nor for any infringements of patents or other rights of third parties that may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Q-Star Test.
(c) Q-Star Test nv, 2003 Revision C - page 6 of 6 Due to continuous pursuit of innovation, the technical specifications listed are subject to change without notice.

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